Ultra compact multitip scanning tunneling microscope with a diameter of 50 mm

Review of Scientific Instruments

Volumn 83, Issue 3, 2012, Pages

  Cherepanov, Vasily ^a,b   Zubkov, Evgeny ^a,b   Junker, Hubertus ^a,b   Korte, Stefan ^a,b   Blab, Marcus ^a,b   Coenen, Peter ^a,b   Voigtländer, Bert ^a,b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b JARA Fundamentals of Future Information Technology (JARA FIT)   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COARSE POSITIONING; FOUR-POINT MEASUREMENTS; IN-VACUUM; OPTICAL MICROSCOPES; RESONANCE FREQUENCIES; ROOM TEMPERATURE; SCANNING TUNNELING MICROSCOPES; SILICIDE NANOWIRES;

GRAPHENE; NANOWIRES; SCANNING ELECTRON MICROSCOPY; SILICIDES;

MICROSCOPES;

EID: 84861604986     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3694990     Document Type: Review

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