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Volumn 23, Issue 14, 2012, Pages
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Fabrication and resistive switching characteristics of high compact Ga-doped ZnO nanorod thin film devices
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Author keywords
[No Author keywords available]
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Indexed keywords
AQUEOUS SOLUTION METHODS;
CONDUCTING FILAMENT;
GA-DOPED ZNO;
HIGH POTENTIAL;
MOLAR RATIO;
PREFERRED ORIENTATIONS;
RESISTANCE RATIO;
RESISTIVE MEMORIES;
RESISTIVE SWITCHING;
RESISTIVE SWITCHING BEHAVIORS;
RESISTIVE SWITCHING MECHANISMS;
RESISTIVE SWITCHING MEMORIES;
SCANNING ELECTRON MICROSCOPIES (SEM);
TRANSMISSION ELECTRON MICROSCOPY (TEM);
WELL-ALIGNED;
DOPING (ADDITIVES);
GALLIUM;
GRAIN BOUNDARIES;
SCANNING ELECTRON MICROSCOPY;
SWITCHING SYSTEMS;
THIN FILM DEVICES;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
ZINC OXIDE;
NANORODS;
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EID: 84863351077
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/23/14/145201 Document Type: Article |
Times cited : (61)
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References (25)
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