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Volumn 66, Issue 9, 2012, Pages 694-697

Thermomigration of Ti in flip-chip solder joints

Author keywords

Diffusion; Intermetallic compounds; Soldering; Titanium

Indexed keywords

CURRENT FLOWS; FLIP CHIP; HEAT OF TRANSPORT; SN-AG SOLDER; SOLDER BUMP; SOLDER JOINTS; THERMOMIGRATION; VOID FORMATION;

EID: 84862829206     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2012.01.020     Document Type: Article
Times cited : (11)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.