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Volumn 80, Issue 4, 2002, Pages 580-582
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Current-crowding-induced electromigration failure in flip chip solder joints
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Author keywords
[No Author keywords available]
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Indexed keywords
CONTACT AREAS;
CONTACT INTERFACE;
CURRENT CROWDING;
ELECTROMIGRATION FAILURES;
ELECTROMIGRATION RESISTANCE;
FLIP CHIP SOLDER BUMP;
FLIP CHIP SOLDER JOINTS;
INTERCONNECT WIRES;
LARGE CURRENT;
ORDERS OF MAGNITUDE;
SOLDER BUMP;
UNIFORM CURRENT DISTRIBUTION;
VOID FORMATION;
ELECTROMIGRATION;
FLIP CHIP DEVICES;
SOLDERING ALLOYS;
WIRE;
SOLDERING;
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EID: 79958223410
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1432443 Document Type: Article |
Times cited : (349)
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References (14)
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