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Volumn 80, Issue 4, 2002, Pages 580-582

Current-crowding-induced electromigration failure in flip chip solder joints

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT AREAS; CONTACT INTERFACE; CURRENT CROWDING; ELECTROMIGRATION FAILURES; ELECTROMIGRATION RESISTANCE; FLIP CHIP SOLDER BUMP; FLIP CHIP SOLDER JOINTS; INTERCONNECT WIRES; LARGE CURRENT; ORDERS OF MAGNITUDE; SOLDER BUMP; UNIFORM CURRENT DISTRIBUTION; VOID FORMATION;

EID: 79958223410     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1432443     Document Type: Article
Times cited : (349)

References (14)
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  • 2
    • 0002334929 scopus 로고    scopus 로고
    • Surface Mount International Conference and Exposition
    • S. Brandenbery and S. Yeh, in "Surface Mount International Conference and Exposition," SMI 98 Proceedings, p. 337 (1998).
    • (1998) SMI 98 Proceedings , vol.337
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  • 7
    • 1842617942 scopus 로고
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    • P. S. Ho and T. Kwok, Rep. Prog. Phys. 52, 301 (1989). rpp RPPHAG 0034-4885
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    • Ho, P.S.1    Kwok, T.2
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    • 0001610086 scopus 로고    scopus 로고
    • jaJAPIAU 0021-8979
    • E. C. C. Yeh and K. N. Tu, J. Appl. Phys. 88, 5680 (2000). jap JAPIAU 0021-8979
    • (2000) J. Appl. Phys. , vol.88 , pp. 5680
    • Yeh, E.C.C.1    Tu, K.N.2
  • 11
    • 0035868168 scopus 로고    scopus 로고
    • jaJAPIAU 0021-8979
    • E. C. C. Yeh and K. N. Tu, J. Appl. Phys. 89, 3203 (2001). jap JAPIAU 0021-8979
    • (2001) J. Appl. Phys. , vol.89 , pp. 3203
    • Yeh, E.C.C.1    Tu, K.N.2
  • 14
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    • unpublished
    • W. J. Choi, unpublished.
    • Choi, W.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.