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Volumn 94, Issue 9, 2009, Pages

Thermomigration in Pb-free SnAg solder joint under alternating current stressing

Author keywords

[No Author keywords available]

Indexed keywords

BRAZING; LITHIUM BATTERIES; MICROELECTRONICS; SOLDERING ALLOYS; THERMOANALYSIS; TIN; WELDING;

EID: 62149085090     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3089872     Document Type: Article
Times cited : (68)

References (14)
  • 2
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    • K. N. Tu, J. Appl. Phys. 0021-8979 10.1063/1.1611263 94, 5451 (2003).
    • (2003) J. Appl. Phys. , vol.94 , pp. 5451
    • Tu, K.N.1
  • 10
    • 34247241706 scopus 로고    scopus 로고
    • 0003-6951 10.1063/1.2721136.
    • H. Y. Hsiao and C. Chen, Appl. Phys. Lett. 0003-6951 10.1063/1.2721136 90, 152105 (2007).
    • (2007) Appl. Phys. Lett. , vol.90 , pp. 152105
    • Hsiao, H.Y.1    Chen, C.2
  • 13
    • 0016919185 scopus 로고
    • 0021-8979 10.1063/1.322647.
    • P. H. Sun and M. Ohring, J. Appl. Phys. 0021-8979 10.1063/1.322647 47, 478 (1976).
    • (1976) J. Appl. Phys. , vol.47 , pp. 478
    • Sun, P.H.1    Ohring, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.