SCOPUS 정보 검색 플랫폼

Volumn 2, Issue 10, 2012, Pages 4404-4414

Crystallisation kinetics in thin films of dihexyl-terthiophene: The appearance of polymorphic phases

(13) Wedl, Bernhard a Resel, Roland a Leising, Günther a Kunert, Birgit a Salzmann, Ingo b Oehzelt, Martin c Koch, Norbert b,c Vollmer, Antje c Duhm, Steffen d Werzer, Oliver e Gbabode, Gabin f Sferrazza, Michele f Geerts, Yves f

a GRAZ UNIVERSITY OF TECHNOLOGY (Austria)

b HUMBOLDT UNIVERSITY (Germany)

c HAHN MEITNER INSTITUT (Germany)

d CHIBA UNIVERSITY (Japan)

e UNIVERSITY OF NEWCASTLE (Australia)

f UNIVERSITÉ LIBRE DE BRUXELLES (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

BULK STRUCTURE; CRITICAL PARAMETER; CRYSTALLINE FILMS; CRYSTALLOGRAPHIC PROPERTIES; DIP COATING; DROP-CASTING; EVAPORATION RATE; KEY PARAMETERS; MICROSCOPY TECHNIQUE; ORGANIC THIN FILMS; PHYSICAL PARAMETERS; PHYSICAL VAPOUR DEPOSITION; POLYMORPHIC CRYSTAL STRUCTURES; POLYMORPHIC PHASIS; PREFERENTIAL GROWTH; PREPARATION PARAMETERS; THIN FILM MORPHOLOGY; WETTING LAYER; X RAY REFLECTIVITY; X-RAY DIFFRACTION METHOD;

ATOMIC FORCE MICROSCOPY; COATINGS; CRYSTAL STRUCTURE; FILM GROWTH; FILM PREPARATION; MONOLAYERS; OPTICAL MICROSCOPY; PHOTOELECTRON SPECTROSCOPY; X RAY DIFFRACTION;

THIN FILMS;

EID: 84861891227 PISSN: None EISSN: 20462069 Source Type: Journal
DOI: 10.1039/c2ra20272g Document Type: Article

Times cited : (66)

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