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Volumn 15, Issue 25, 2005, Pages 2444-2449

Structural characterisation of single crystals and thin films of α,ω-dihexylquaterthiophene

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; FIELD EFFECT TRANSISTORS; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 22544439960     PISSN: 09599428     EISSN: None     Source Type: Journal    
DOI: 10.1039/b504233j     Document Type: Article
Times cited : (36)

References (39)
  • 19
    • 0000350870 scopus 로고
    • Defect structures and growth mechanisms of long-chain normal alkanes
    • ed. E. Kaldis, North-Holland Publishing Company, Amsterdam
    • (b) R. Boistelle, Defect structures and growth mechanisms of long-chain normal alkanes, in Current Topics in Materials Science, Vol. 4, ed. E. Kaldis, North-Holland Publishing Company, Amsterdam, 1980.
    • (1980) Current Topics in Materials Science , vol.4
    • Boistelle, R.1
  • 38
    • 22544459114 scopus 로고    scopus 로고
    • Kristallographisches Institut der Universität, Freiburg im Breisgau, Germany
    • E. Keller, SCHAKAL, Kristallographisches Institut der Universität, Freiburg im Breisgau, Germany, 2003.
    • (2003) SCHAKAL
    • Keller, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.