Full X-ray pattern analysis of vacuum deposited pentacene thin films

European Physical Journal B

Volumn 66, Issue 4, 2008, Pages 455-459

  Werzer, O ^a   Stadlober, B ^b   Haase, A ^b   Oehzelt, M ^c   Resel, R ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b JOANNEUM RESEARCH   (Austria)

^c JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMICAL SCATTERINGS; LAYER THICKNESS; MICRO STRAINS; PENTACENE THIN FILMS; REFLECTIVITY MEASUREMENTS; THIN FILM PHASE; X- RAY DIFFRACTIONS; X-RAY PATTERNS;

CRYSTALLITE SIZE; CRYSTALLITES; MAGNETIC FILMS; MOLECULAR BEAM EPITAXY; NANOCRYSTALLINE ALLOYS; PROGRAMMING THEORY; REFLECTION; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILM DEVICES; THIN FILMS; X RAY DIFFRACTION;

SOLIDS;

EID: 58849119884     PISSN: 14346028     EISSN: 14346036     Source Type: Journal    
DOI: 10.1140/epjb/e2008-00452-x     Document Type: Article

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