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Volumn , Issue , 2006, Pages 1-356
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Thin Film Analysis by X-Ray Scattering
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 84891005643
PISSN: None
EISSN: None
Source Type: Book
DOI: 10.1002/3527607595 Document Type: Book |
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Times cited : (947)
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References (0)
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