Evaluation of organic sub-monolayers by X-ray based measurements under gracing incident conditions

EPJ Applied Physics

Volumn 46, Issue 2, 2009, Pages

  Werzer, O ^a   Stadlober, B ^b   Haase, A ^b   Flesch, H G ^a   Resel, R ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b JOANNEUM RESEARCH   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; DIFFUSE SCATTERINGS; ELECTRONIC PERFORMANCE; IN-SITU EXPERIMENTS; ISLAND FORMATIONS; NUCLEATION PROCESS; ORGANIC SYSTEMS; PENTACENE; SPECULAR X-RAY REFLECTIVITIES; STRUCTURAL INVESTIGATIONS; SUB-MONOLAYERS; X-RAY BASED MEASUREMENTS;

DIELECTRIC MATERIALS; MONOLAYERS; SEMICONDUCTING ORGANIC COMPOUNDS; SILICA; SILICON COMPOUNDS; SIZE SEPARATION;

ELECTRON ENERGY LEVELS;

EID: 65249095557     PISSN: 12860042     EISSN: 12860050     Source Type: Journal    
DOI: 10.1051/epjap/2009038     Document Type: Article

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