Temperature stability of the pentacene thin-film phase

Applied Physics Letters

Volumn 99, Issue 22, 2011, Pages

  Moser, Armin ^a   Novák, Jiří ^a   Flesch, Heinz Georg ^a   Djuric, Tatjana ^a   Werzer, Oliver ^a   Haase, Anja ^b   Resel, Roland ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b JOANNEUM RESEARCH   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

BULK PHASE; CRYSTAL STRUCTURE AND MORPHOLOGY; GEOMETRICAL CONSIDERATIONS; GRAZING INCIDENCE X-RAY DIFFRACTION; HEIGHT DISTRIBUTION; MOLECULAR PACKINGS; NON-LINEAR EXPANSION; PENTACENE THIN FILMS; PENTACENES; PHASE TRANSFORMATION; TEMPERATURE STABILITY; UNIT CELLS;

CRYSTAL STRUCTURE; SEMICONDUCTING ORGANIC COMPOUNDS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

THERMAL EXPANSION;

EID: 82955241370     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3665188     Document Type: Article

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