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Volumn 100, Issue 21, 2012, Pages

Intrinsic origin of negative fixed charge in wet oxidation for silicon carbide

Author keywords

[No Author keywords available]

Indexed keywords

C ATOMS; FIRST-PRINCIPLES CALCULATION; NEGATIVE FIXED CHARGE; THERMAL OXIDATION; WET OXIDATION;

EID: 84861819129     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4722782     Document Type: Article
Times cited : (21)

References (19)
  • 13
    • 0042113153 scopus 로고
    • 10.1103/PhysRev.140.A1133
    • W. Kohn and L. T. Sham, Phys. Rev. 140, A1133 (1965). 10.1103/PhysRev.140.A1133
    • (1965) Phys. Rev. , vol.140 , pp. 1133
    • Kohn, W.1    Sham, L.T.2
  • 17
    • 20544463457 scopus 로고
    • 10.1103/PhysRevB.41.7892
    • D. Vanderbilt, Phys. Rev. B 41, 7892 (1990). 10.1103/PhysRevB.41.7892
    • (1990) Phys. Rev. B , vol.41 , pp. 7892
    • Vanderbilt, D.1
  • 18
    • 0034261329 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.62.6158
    • P. E. Blöchl, Phys. Rev. B 62, 6158 (2000). 10.1103/PhysRevB.62.6158
    • (2000) Phys. Rev. B , vol.62 , pp. 6158
    • Blöchl, P.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.