Time-domain fluorescence lifetime imaging techniques suitable for solid-state imaging sensor arrays

Sensors (Switzerland)

Volumn 12, Issue 5, 2012, Pages 5650-5669

  Li, David Day Uei ^a   Ameer Beg, Simon ^b   Arlt, Jochen ^c   Tyndall, David ^c   Walker, Richard ^c   Matthews, Daniel R ^d   Visitkul, Viput ^b   Richardson, Justin ^c   Henderson, Robert K ^c  

^a UNIVERSITY OF SUSSEX   (United Kingdom)

^b KING'S COLLEGE LONDON   (United Kingdom)

^c UNIVERSITY OF EDINBURGH   (United Kingdom)

^d UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

CMOS; FLIM; Fluorescence lifetime imaging microscopy; Lifetime based sensing; Multi decay; Single decay; Single photon avalanche diode; Time domain FLIM

Indexed keywords

AVALANCHE DIODES; CMOS INTEGRATED CIRCUITS; FLUORESCENCE IMAGING; HARDWARE; PARTICLE BEAMS; PHOTONS; RATS;

FLIM; FLUORESCENCE LIFETIME IMAGING MICROSCOPY; LIFETIME-BASED SENSING; MULTI-DECAY; SINGLE PHOTON AVALANCHE DIODE; SINGLE-DECAY; TIME DOMAIN;

TIME DOMAIN ANALYSIS;

EID: 84861569598     PISSN: 14248220     EISSN: None     Source Type: Journal    
DOI: 10.3390/s120505650     Document Type: Review

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