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Volumn , Issue , 2010, Pages

A 3x3, 5μm pitch, 3-transistor single photon avalanche diode array with integrated 11V bias generation in 90nm CMOS technology

Author keywords

[No Author keywords available]

Indexed keywords

90NM CMOS; BREAKDOWN VOLTAGE; CHARGE PUMP; CMOS AVALANCHE PHOTODIODES; DARK COUNT RATE; FILL FACTOR; HIGH VOLTAGE GENERATION; PHOTON DETECTION EFFICIENCY; PIXEL PITCH; SINGLE-PHOTON AVALANCHE DIODE ARRAYS; SMALL PIXEL PITCH; WAFER LEVEL;

EID: 79951817094     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2010.5703359     Document Type: Conference Paper
Times cited : (25)

References (9)
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    • (2008) IEEE Transactions on Electron Devices , vol.55 , Issue.3 , pp. 760-767
    • Faramarzpour, N.1    Deen, M.J.2    Shirani, S.3    Fang, Q.4
  • 2
    • 72849145317 scopus 로고    scopus 로고
    • A SPAD-based pixel linear array for high-speed time-gated fluorescence lifetime imaging
    • L. Pancheri, D. Stoppa, "A SPAD-based pixel linear array for high-speed time-gated fluorescence lifetime imaging", IEEE European Solid-State Circuits Conference, pp. 428-431, 2009.
    • (2009) IEEE European Solid-State Circuits Conference , pp. 428-431
    • Pancheri, L.1    Stoppa, D.2
  • 4
    • 37549042854 scopus 로고    scopus 로고
    • Microconcentrators to recover fill-factor in image photodetectors with pixel onboard processing circuits
    • S. Donati, G. Martini, M. Norgia, "Microconcentrators to recover fill-factor in image photodetectors with pixel onboard processing circuits," Optics Express 15, Issue 26, pp. 18066-18075, 2007.
    • (2007) Optics Express , vol.15 , Issue.26 , pp. 18066-18075
    • Donati, S.1    Martini, G.2    Norgia, M.3
  • 7
    • 67650653754 scopus 로고    scopus 로고
    • A low dark count single photon avalanche diode structure compatible with standard nanometer scale CMOS technology
    • J. A. Richardson, L. A. Grant, R. K. Henderson, "A low dark count single photon avalanche diode structure compatible with standard nanometer scale CMOS technology", IEEE Photonics Technology Letters, Vol. 21, No. 14, pp. 1020-1022, 2009.
    • (2009) IEEE Photonics Technology Letters , vol.21 , Issue.14 , pp. 1020-1022
    • Richardson, J.A.1    Grant, L.A.2    Henderson, R.K.3
  • 8
    • 33646425572 scopus 로고    scopus 로고
    • Design of charge pump circuit with consideration of gate-oxide reliability in low-voltage CMOS processes
    • Ming-Dou Ker, Shih-Lun Chen, Chia-Shen Tsai., "Design of charge pump circuit with consideration of gate-oxide reliability in low-voltage CMOS processes", IEEE Journal of Solid-State Circuits, Vol. 41, No. 5, pp. 1100-1107, 2005.
    • (2005) IEEE Journal of Solid-State Circuits , vol.41 , Issue.5 , pp. 1100-1107
    • Ker, M.-D.1    Chen, S.-L.2    Tsai, C.-S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.