Real-time fluorescence lifetime imaging system with a 32 × 32 0.13μm CMOS low dark-count single-photon avalanche diode array

Optics Express

Volumn 18, Issue 10, 2010, Pages 10257-10269

  Li, Day Uei ^a   Arlt, Jochen ^a   Richardson, Justin ^a,b   Walker, Richard ^a,b   Buts, Alex ^a   Stoppa, David ^c   Charbon, Edoardo ^d   Henderson, Robert ^a  

^a UNIVERSITY OF EDINBURGH   (United Kingdom)

^b STMicroelectronics Ltd Bristol   (United Kingdom)

^c FONDAZIONE BRUNO KESSLER   (Italy)

^d DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CAMERAS; CMOS INTEGRATED CIRCUITS; FLUOROPHORES; OPTOELECTRONIC DEVICES;

DARK COUNTS; DETECTOR ARRAYS; DYNAMIC RANGE; EXTRACTION METHOD; FLUORESCENCE LIFETIME IMAGING; FLUORESCENCE LIFETIME IMAGING MICROSCOPY; FLUORESCENCE LIFETIMES; FUNGAL SPORES; LIFETIME CALCULATION; MICROFLUIDIC MIXING; NEUROSPORA CRASSA; SINGLE PHOTON AVALANCHE DIODE; SINGLE-PHOTON AVALANCHE DIODE ARRAYS; SPAD ARRAY; SYSTEM-BASED; TEST SAMPLES; WIDE-FIELD;

AVALANCHE DIODES;

ARTICLE; COMPUTER SYSTEM; EQUIPMENT; EQUIPMENT DESIGN; FLUORESCENCE MICROSCOPY; IMAGE ENHANCEMENT; INSTRUMENTATION; PHOTON; REPRODUCIBILITY; SEMICONDUCTOR; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING;

COMPUTER SYSTEMS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; MICROSCOPY, FLUORESCENCE; PHOTONS; REPRODUCIBILITY OF RESULTS; SEMICONDUCTORS; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 77952733312     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.010257     Document Type: Article

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