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Volumn 22, Issue 22, 2012, Pages 11323-11334

Electrical and structural properties of Bi 2Te 3 and Sb 2Te 3 thin films grown by the nanoalloying method with different deposition patterns and compositions

(8) Winkler, M a Liu, X b Konig J D a Buller, S b Schurmann U b Kienle, L b Bensch, W b Bottner H a

a FRAUNHOFER INSTITUTE FOR PHYSICAL MEASUREMENT TECHNIQUES IPM (Germany)

b UNIVERSITY OF KIEL (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; COMPOUND FORMATION; DEPOSITION PATTERNS; ELECTRICAL AND STRUCTURAL PROPERTIES; ELECTRICAL CONDUCTIVITY; IN-SITU XRD; LAYER STACKS; NANOALLOYING; ROOM TEMPERATURE; TEMPERATURE DEPENDENT; TEMPERATURE-DEPENDENT MEASUREMENTS; THERMOELECTRIC PROPERTIES;

ANTIMONY; ANTIMONY COMPOUNDS; BISMUTH; BISMUTH COMPOUNDS; DEPOSITION; ELECTRIC CONDUCTIVITY; ENERGY DISPERSIVE SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; THERMAL CONDUCTIVITY; THIN FILMS; TRANSPORT PROPERTIES; X RAY DIFFRACTION ANALYSIS;

VAPOR DEPOSITION;

EID: 84861326299 PISSN: 09599428 EISSN: 13645501 Source Type: Journal
DOI: 10.1039/c2jm30363a Document Type: Article

Times cited : (46)

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