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Volumn 27, Issue 8, 2010, Pages

Composition-dependent characterization of Sb2Te3 thin films prepared by ion beam sputtering deposition

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY; CARRIER CONCENTRATION; ION BEAMS; SEEBECK COEFFICIENT; SPUTTERING; SUBSTRATES; TELLURIUM COMPOUNDS; X RAY DIFFRACTION;

EID: 78649343930     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/27/8/087201     Document Type: Article
Times cited : (15)

References (20)
  • 2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.