Thermoelectric properties of Bi-Te films with controlled structure and morphology

Journal of Applied Physics

Volumn 105, Issue 12, 2009, Pages

  Li Bassi, A ^a   Bailini, A ^a   Casari, C S ^a   Donati, F ^a   Mantegazza, A ^a   Passoni, M ^a   Russo, V ^a   Bottani, C E ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER DENSITY; COMPACT MORPHOLOGY; COMPACT STRUCTURES; CONTROLLED STRUCTURES; CRYSTALLINE GRAINS; CRYSTALLINITY; DEPOSITED MATERIALS; DIFFERENT STRUCTURE; IN-PLANE ELECTRICAL RESISTIVITY; PHONON THERMAL CONDUCTIVITY; POWER FACTORS; ROOM TEMPERATURE; SUBMICROMETER; TEMPERATURE RANGE; THERMOELECTRIC PROPERTIES; THERMOELECTRIC TRANSPORT PROPERTIES;

CARRIER MOBILITY; ELECTRIC POWER FACTOR; ELECTRIC RESISTANCE; GRAIN BOUNDARIES; MORPHOLOGY; PROGRAMMABLE LOGIC CONTROLLERS; PULSED LASER DEPOSITION; SEEBECK COEFFICIENT; TELLURIUM COMPOUNDS; THERMAL CONDUCTIVITY; THIN FILMS; TRANSPORT PROPERTIES;

STRUCTURAL PROPERTIES;

EID: 67650242374     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3147870     Document Type: Conference Paper

References (38)

1. G. S. Nolas, J. Sharp, and H. J. Goldsmid, Thermoelectrics (Springer, New York, 2001), pp. 117-119.
2. S. B. Riffat and X. Ma, Appl. Therm. Eng. 1359-4311 23, 913 (2003). 10.1016/S1359-4311(03)00012-7
3. G. S. Nolas, J. Sharp, and H. J. Goldsmid, Thermoelectrics (Springer, New York, 2001), p. 12.
4. G. A. Slack, in Thermoelectric Handbook, edited by, M. Rowe, (CRC, Boca Raton, 1995) pp. 407-440.
5. M. S. Dresselhaus, G. Chen, M. Y. Tang, R. Yang, H. Lee, D. Wang, Z. Ren, J. P. Fleurial, and P. Gogna, Adv. Mater. (Weinheim, Ger.) 0935-9648 19, 1043 (2007). 10.1002/adma.200600527
6. R. Venkatasubramanian, E. Siivola, T. Colpitts, and B. O'Quinn, Nature (London) 0028-0836 413, 597 (2001). 10.1038/35098012
7. A. Boulouz, S. Chakraborty, A. Giani, F. Pascal Delannoy, A. Boyer, and J. Schumann, J. Appl. Phys. 0021-8979 89, 5009 (2001). 10.1063/1.1360701
8. G. E. Bulman, E. Siivola, B. Shen, and R. Venkatasubramanian, Appl. Phys. Lett. 0003-6951 89, 122117 (2006). 10.1063/1.2353805
9. L. W. da Silva, M. Kaviany, and C. Uher, J. Appl. Phys. 0021-8979 97, 114903 (2005). 10.1063/1.1914948
10. N. Peranio, O. Eibl, and J. Nurnus, J. Appl. Phys. 0021-8979 100, 114306 (2006). 10.1063/1.2375016
11. Pulsed Laser Deposition of Thin Films, edited by, D. B. Chrisey, and, G. K. Hubler, (Wiley, New York, 1994).
12. A. Dauscher, A. Thomy, and H. Scherrer, Thin Solid Films 0040-6090 280, 61 (1996). 10.1016/0040-6090(95)08221-2
13. R. S. Makala, K. Jagannadham, and B. C. Sales, J. Appl. Phys. 0021-8979 94, 3907 (2003). 10.1063/1.1600524
14. M. Pavelka, R. Zeipl, M. Jelínek, J. Walachová, V. Studnička, and K. Jurek, Surf. Coat. Technol. 0257-8972 200, 273 (2005). 10.1016/j.surfcoat.2005.02.044
15. R. Zeipl, M. Pavelka, M. Jelínek, J. Chval, P. Lošták, K. Ždánsk, J. Vaniš, S. Karamazov, S. Vacková, and J. Walachová, Phys. Status Solidi C 1610-1634 0, 867 (2003). 10.1002/pssc.200306251
16. G. S. Nolas, J. Sharp, and H. J. Goldsmid, Thermoelectrics (Springer, New York, 2001), p. 244.
17. J. Walachová, R. Zeipl, J. Zelinka, V. Malina, M. Pavelka, M. Jelínek, V. Studnička, and P. Lošták, Appl. Phys. Lett. 0003-6951 87, 081902 (2005). 10.1063/1.2001755
18. R. Zeipl, J. Walachová, M. Pavelka, M. Jelínek, V. Studnička, and T. Kocourek, Appl. Phys. A: Mater. Sci. Process. 0947-8396 93, 663 (2008). 10.1007/s00339-008-4692-y
19. A. Bailini, F. Donati, M. Zamboni, V. Russo, M. Passoni, C. S. Casari, A. Li Bassi, and C. E. Bottani, Appl. Surf. Sci. 0169-4332 254, 1249 (2007). 10.1016/j.apsusc.2007.09.039
20. V. Russo, A. Bailini, M. Zamboni, M. Passoni, C. Conti, C. S. Casari, A. Li Bassi and C. E. Bottani, J. Raman Spectrosc. 0377-0486 39, 205 (2008). 10.1002/jrs.1874
21. H. V. Warren and M. A. Peacock, Univ. Toronto Stud. Geol. 49, 55 (1945).
22. H. Shimazaki and T. Ozawa, Am. Mineral. 0003-004X 63, 1162 (1978).
23. K. Yamana, K. Kihara, and T. Matsumoto, Acta Crystallogr., Sect. B: Struct. Crystallogr. Cryst. Chem. 0567-7408 35, 147 (1979). 10.1107/ S0567740879002788
24. Y. Kim, S. Cho, A. Di Venere, G. K. L. Wong, and J. B. Ketterson, Phys. Rev. B 0163-1829 63, 155306 (2001). 10.1103/PhysRevB.63.155306
25. J. W. G. Bos, H. W. Zandbergen, M. -H. Lee, N. P. Ong, and R. J. Cava, Phys. Rev. B 0163-1829 75, 195203 (2007). 10.1103/PhysRevB.75.195203
26. G. J. Snyder and E. S. Toberer, Nature Mater. 1476-1122 7, 105 (2008). 10.1038/nmat2090
27. L. J. van der Pauw, Philips Res. Rep. 0031-7918 13, 1 (1958).
28. A. Koma, J. Cryst. Growth 0022-0248 201-202, 236 (1999). 10.1016/S0022-0248(98)01329-3
29. M. M. Stasova, Zh. Strukt. Khim. 0044-4634 8, 655 (1967); M. M. Stasova [transl. J. Struct. Chem. 8, 584 (1967)]. 10.1007/BF01551253
30. M. H. Francombe, Br. J. Appl. Phys. 0508-3443 9, 415 (1958). 10.1088/0508-3443/9/10/307
31. A. Brown and B. Lewis, J. Phys. Chem. Solids 0022-3697 23, 1597 (1962). 10.1016/0022-3697(62)90242-1
32. M. H. Francombe, Philos. Mag. 10, 989 (1964). 10.1080/14786436408225407
33. M. M. Stasova, Zh. Strukt. Khim. 0044-4634 5, 793 (1964); M. M. Stasova [transl. J. Struct. Chem. 5, 73 (1964)].
34. M. M. Stasova and O. G. Karpinskii, Zh. Strukt. Khim. 0044-4634 8, 85 (1967); M. M. Stasova and O. G. Karpinskii [transl. J. Struct. Chem. 8, 69 (1967)]. 10.1007/BF00741728
35. H. Scherrer and S. Scherrer, Thermoelectric properties of bismuth antimony telluride solid solutions in Thermoelectrics Handbook, D. M. Rowe, ed. (CRC/Taylor & Francis, Boca Raton, 2006).
36. C. B. Satterthwaite and R. W. Ure, Jr., Phys. Rev. 108, 1164 (1957). 10.1103/PhysRev.108.1164
37. B. Y. Yoo, C. K. Huang, J. R. Lim, J. Herman, M. A. Ryan, J. P. Fleurial, and N. V. Myung, Electrochim. Acta 0013-4686 50, 4371 (2005). 10.1016/j.electacta.2005.02.016
38. D. -H. Kim and T. Mitani, J. Alloys Compd. 0925-8388 399, 14 (2005). 10.1016/j.jallcom.2005.03.021