Deposition of thin Bi2Te3 and Sb2Te3 films by pulsed laser ablation

Semiconductors

Volumn 44, Issue 4, 2010, Pages 544-549

  Virt, I S ^a,b   Shkumbatyuk, T P ^a   Kurilo, I V ^c   Rudyi, I O ^c   Lopatinskyi, T Ye ^c   Linnik, L F ^d   Tetyorkin, V V ^d   Phedorov, A G ^e  

^a DROHOBYCH IVAN FRANKO STATE PEDAGOGICAL UNIVERSITY   (Ukraine)

^b UNIVERSITY OF RZESZÓW   (Poland)

^c LVIV POLYTECHNIC NATIONAL UNIVERSITY   (Ukraine)

^d INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^e INSTITUTE FOR SINGLE CRYSTALS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77951735253     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1063782610040238     Document Type: Article

References (20)

1. A. Ioffe, Semiconductor Thermoelements and Thermoelectric Cooling (Infosearch, London, 1957).
2. 3 (Moscow, Nauka, 1972) [in Russian].
3. Thermoelectrics Handbook: Macro to Nano, Ed. by D. M. Rowe (Taylor and Francis, London, 2006).
4. R. Venkatasubramanian, E. Silvola, T. Colpitts, and B. O'Quinn, Nature 413, 597 (2001).
5. P. G. Ganesan and V. Damodara Das, Mater. Lett. 60, 2059 (2005).
6. R. Sathyamoorthy, J. Dheepa, and A. Subbarayan, J. Cryst. Growth 281, 563 (2005).
7. Xingkai Duan, Junyou Yang, Wei Zhong, Wei Zhu, Siqian Bao, and Xi'an Fan, Powder Technol. 172, 63 (2007).
8. L. M. Goncalves, C. Couto, P. Alpuim, D. M. Rowe, and J. H. Correia, Sens. Actuat. 130-131, 346 (2006).
9. Yu. A. Boikov and V. A. Danilov, Zh. Tekh. Fiz. 78, 63 (2008) [Tech. Phys. 53, 348 (2008)].
10. R. Venkatasubramanian, T. Colpitts, E. Watko, M. Lamvik, and N. El-Masry, J. Cryst. Growth 170, 817 (1997).
11. J. J. Dubowski, Chemotronics 3(7), 66 (1988).
12. S. V. Gaponov, V. M. Luskin, and N. N. Salashchenko, Pis'ma Zh. Tekh. Fiz. 5, 516 (1979) [Sov. Tech. Phys. Lett. 5, 210 (1979)].
13. Joint Committee on Powder Diffraction Standards (JCPDS), Diffraction Data Card (Am. Soc. for Testing and Materials).
14. S. Cho, Y. Kim, A. DiVenere, G. K. Wong, J. B. Ketterson, and J. R. Meyer, Appl. Phys. Lett. 75, 1401 (1999).
15. B. D. Cullity, Elements of X-ray Diffraction, 2nd ed. (Addison-Wesley, Reading, MA, 1978), p. 284, 366.
16. J. T. Cheung, in Laser-controlled Chem. Process. Surfaces Symp. (Boston, USA, 1983), p. 301.
17. Yu. V. Goloshikhin, K. E. Mironov, and A. Ya. Polyakov, Poverkhnost', No. 12, 12 (1991).
18. I. O. Rudyi, I. V. Kurilo, M. S. Frugynskyj, M. Kuzma, J. Zawislak, and I. S. Virt, Appl. Surf. Sci. 154-155, 206 (2000).
19. I. P. Kalinkin, V. B. Aleskovskii, and A. V. Simashkevich, Epitaxial Films of II-VI Compounds (Leningr. Univ., Leningrad, 1978), p. 218.
20. O. Madelung, Semiconductors-Basic Data, 2nd ed. (Springer, 1996), p. 207.