Bi 2Te 3-Sb 2Te 3 superlattices grown by nanoalloying

Journal of Electronic Materials

Volumn 40, Issue 5, 2011, Pages 1266-1270

  König, Jan D ^a   Winkler, M ^a   Buller, S ^b   Bensch, W ^b   Schurmann U ^b   Kienle, L ^b   Bottner H ^a  

^a FRAUNHOFER INSTITUTE FOR PHYSICAL MEASUREMENT TECHNIQUES IPM   (Germany)

^b UNIVERSITY OF KIEL   (Germany)

Author keywords

Bi 2Te 3 Sb 2Te 3 superlattices; nanoalloying; Thermoelectrics

Indexed keywords

ANNEALED STATE; AS-GROWN; BI 2TE 3-SB 2TE 3 SUPERLATTICES; COLD SUBSTRATES; ELECTRICAL MEASUREMENT; ENERGY DISPERSIVE X-RAY; LAYER THICKNESS; LOWER LIMITS; NANOALLOYING; P-TYPE; SEM; TEM; THERMOELECTRIC PARAMETERS; THERMOELECTRIC PROPERTIES; THERMOELECTRICS; THIN LAYERS;

CRYSTAL STRUCTURE; SCANNING ELECTRON MICROSCOPY; SUPERLATTICES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

BISMUTH COMPOUNDS;

EID: 84864167469     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-011-1578-0     Document Type: Conference Paper

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