MOCVD of Bi2Te3, Sb2Te3 and their superlattice structures for thin-film thermoelectric applications

Journal of Crystal Growth

Volumn 170, Issue 1-4, 1997, Pages 817-821

  Venkatasubramanian, R ^a   Colpitts, T ^a   Watko, E ^a   Lamvik, M ^b   El Masry, N ^c  

^a RTI INTERNATIONAL   (United States)

^b MCNC   (United States)

^c NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOW ENERGY ELECTRON DIFFRACTION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING ANTIMONY COMPOUNDS; SEMICONDUCTING BISMUTH COMPOUNDS; SEMICONDUCTING FILMS; SEMICONDUCTING TELLURIUM COMPOUNDS; SEMICONDUCTOR GROWTH; SUPERLATTICES; THERMAL CONDUCTIVITY OF SOLIDS; THERMOELECTRICITY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

BISMUTH TELLURIDE; SEEBECK COEFFICIENTS;

METALLORGANIC CHEMICAL VAPOR DEPOSITION;

EID: 0030707119     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)00656-2     Document Type: Article

References (6)

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5. B.E. Warren, X-ray Diffraction (Addison-Wesley, Reading, MA, 1969).
6. D.G. Cahill, M. Katiyar and J.R. Abelson, Phys. Rev. B 50 (1994) 6077.