A method to provide rapid in situ determination of tip radius in dynamic atomic force microscopy

Review of Scientific Instruments

Volumn 83, Issue 4, 2012, Pages

  Santos, Sergio ^a,b   Guang, Li ^b   Souier, Tewfik ^b   Gadelrab, Karim ^b   Chiesa, Matteo ^b   Thomson, Neil H ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

^b KHALIFA UNIVERSITY   (United Arab Emirates)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT CONDITIONS; DATA COMPARISONS; DYNAMIC ATOMIC FORCE MICROSCOPY; IN-SITU; IN-SITU CHARACTERIZATION; QUANTITATIVE COMPARISON; QUANTITATIVE DATA; REPULSIVE FORCES; TIP RADIUS;

NANOCANTILEVERS;

ATOMIC FORCE MICROSCOPY;

EID: 84860584865     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4704376     Document Type: Review

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44. See supplementary material at http://dx.doi.org/10.1063/1.4704376 E-RSINAK-83-091204 for further details on the sequence of APD obtained for the system described in Fig..