Influence of the macroscopic shape of the tip on the contrast in scanning polarization force microscopy images

Nanotechnology

Volumn 20, Issue 28, 2009, Pages

  Sacha, G M ^a   Cardellach, M ^b   Segura, J J ^b   Moser, J ^b   Bachtold, A ^b   Fraxedas, J ^b   Verdaguer, A ^b  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b CATALAN INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY ICN2   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC RESPONSE; ELECTROSTATIC FORCE MICROSCOPY; EXPERIMENTAL MEASUREMENTS; GENERALIZED IMAGE CHARGE METHODS; GRAPHENE; MACROSCOPIC SHAPES; NUMERICAL SIMULATION; QUANTITATIVE ANALYSIS; QUASI-LINEAR; SCANNING POLARIZATION FORCE MICROSCOPY; THREE ORDERS OF MAGNITUDE; TIP APEX; TIP-SAMPLE DISTANCE;

COMPUTER SIMULATION; POLARIZATION; SCANNING; SILICON COMPOUNDS; SILICON OXIDES;

ELECTROSTATIC FORCE;

ARTICLE; CONTROLLED STUDY; DIELECTRIC CONSTANT; ELECTRICITY; IMAGE ANALYSIS; IMAGING SYSTEM; MATHEMATICAL COMPUTING; NANOTECHNOLOGY; POLARIZATION MICROSCOPY; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SCANNING FORCE MICROSCOPY; SIMULATION; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; METHODOLOGY; THEORETICAL MODEL;

COMPUTER SIMULATION; MICROSCOPY, ATOMIC FORCE; MODELS, THEORETICAL;

EID: 67651166881     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/28/285704     Document Type: Article

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