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Volumn 135, Issue 6, 2011, Pages

Determining concentration depth profiles in fluorinated networks by means of electric force microscopy

(7) Miccio, Luis A a,b Kummali, Mohammed M b,c Montemartini, Pablo E a Oyanguren, Patricia A a Schwartz, Gustavo A b Alegra, Ngel b,c Colmenero, Juan b,c,d

a UNIVERSIDAD NACIONAL DE MAR DEL PLATA (Argentina)

b CENTRO MIXTO CSIC UPV EHU (Spain)

c UNIVERSITY OF THE BASQUE COUNTRY UPV EHU (Spain)

d DONOSTIA INTERNATIONAL PHYSICS CENTER DIPC (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION DEPTH PROFILES; COMPOSITION GRADIENT; CONCENTRATION-DEPTH PROFILE; DIELECTRIC PERMITTIVITIES; FLUORINE CONCENTRATIONS; NANOMETRIC RESOLUTION; NANOSCALE RESOLUTIONS; NEAR-SURFACE;

FLUORINE; PHOTOELECTRON SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRIC FORCE MICROSCOPY;

EID: 80051862366 PISSN: 00219606 EISSN: None Source Type: Journal
DOI: 10.1063/1.3624574 Document Type: Article

Times cited : (7)

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