Electrostatic force spectroscopy on insulating surfaces: The effect of capacitive interaction

Nanotechnology

Volumn 20, Issue 36, 2009, Pages

  Takagi, Akihiko ^a,b   Yamada, Fumihiko ^a   Matsumoto, Takuya ^a   Kawai, Tomoji ^a  

^a OSAKA UNIVERSITY   (Japan)

^b INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE FEEDBACK; AFM TIP; APPLIED BIAS; AU(1 1 1 ); CANTILEVER OSCILLATION; DYNAMIC MODES; ELECTROSTATIC PROPERTIES; INSULATING SURFACES; INSULATOR SURFACES; METAL SURFACES; POTENTIAL DIFFERENCE; QUADRATIC DEPENDENCE; RESONANT FREQUENCY SHIFT; SURFACE PROBES; SURFACE SEPARATION;

ATOMIC FORCE MICROSCOPY; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; INSULATION; NATURAL FREQUENCIES; PROBES;

SURFACE PROPERTIES;

ALUMINUM OXIDE; GOLD;

ARTICLE; ATOMIC FORCE MICROSCOPY; DIELECTRIC CONSTANT; ELECTRIC CAPACITANCE; ELECTRICITY; ELECTRODE; OSCILLATION; PRIORITY JOURNAL; SURFACE PROPERTY;

EID: 70349120411     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/36/365501     Document Type: Article

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