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Volumn 99, Issue 6, 2011, Pages

Concentration dependence of drift and magnetoresistance ballistic mobility in a scaled-down metal-oxide semiconductor field-effect transistor

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION DEPENDENCE; DRIFT MOBILITIES; EXPERIMENTAL DATA; INJECTED CARRIERS; MEAN FREE PATH; METAL OXIDE SEMICONDUCTOR; NONSTATIONARY;

EID: 84860389656     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3621885     Document Type: Article
Times cited : (11)

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