-
1
-
-
77956525581
-
Development trends of power semiconductors for hybrid vehicles
-
June
-
T. Kanata, K. Nishiwaki, K. Hamada, "Development trends of power semiconductors for hybrid vehicles," International Power Electronics Conference (IPEC), pp. 778-782, June 2010
-
(2010)
International Power Electronics Conference (IPEC)
, pp. 778-782
-
-
Kanata, T.1
Nishiwaki, K.2
Hamada, K.3
-
2
-
-
79951852730
-
State of the art of high temperature power electronics
-
C. Buttay, D. Planson, B. Allard, D. Bergogne, P. Bevilacqua, C. Joubert, M. Lazar, C. Martin, H. Morel, D. Tournier, C. Raynaud, "State of the art of high temperature power electronics," Materials Science and Engineering: B, vol. 176, no. 4, pp. 283-288, 2011
-
(2011)
Materials Science and Engineering: B
, vol.176
, Issue.4
, pp. 283-288
-
-
Buttay, C.1
Planson, D.2
Allard, B.3
Bergogne, D.4
Bevilacqua, P.5
Joubert, C.6
Lazar, M.7
Martin, C.8
Morel, H.9
Tournier, D.10
Raynaud, C.11
-
3
-
-
77956594366
-
Development of new power control unit for compact-class vehicle
-
June
-
S. Nozawa, T. Maekawa, E. Yagi, Y. Terao, H. Kohno, "Development of new power control unit for compact-class vehicle,"International Symposium on Power Semiconductor Devices & IC's (ISPSD), pp. 43-45, June 2010
-
(2010)
International Symposium on Power Semiconductor Devices & IC's (ISPSD)
, pp. 43-45
-
-
Nozawa, S.1
Maekawa, T.2
Yagi, E.3
Terao, Y.4
Kohno, H.5
-
4
-
-
24144443892
-
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue
-
B. Khong, P. Tounsi, Ph. Dupuy, X. Chauffleur, M Legros, A. Deram, C. Levade, G. Vanderschaeve, J-M. Dorkel, J-P. Fradin, "Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue,"Microelectronics Reliability, vol. 45, pp. 1717-1722, 2005
-
(2005)
Microelectronics Reliability
, vol.45
, pp. 1717-1722
-
-
Khong, B.1
Tounsi, P.2
Dupuy, Ph.3
Chauffleur, X.4
Legros, M.5
Deram, A.6
Levade, C.7
Vanderschaeve, G.8
Dorkel, J.-M.9
Fradin, J.-P.10
-
5
-
-
84992557342
-
Electrical characterizations and evaluation of thermo-mechanical stresses of a power module dedicated to high temperature applications
-
L. Dupont, Z. Khatir, S. Lefebvre, R. Meuret, B. Parmentier, S. Bontemps, "Electrical characterizations and evaluation of thermo-mechanical stresses of a power module dedicated to high temperature applications," in European Conference on Power Electronics and Applications, 2006, pp. (P.1-P.11)
-
European Conference on Power Electronics and Applications, 2006
-
-
Dupont, L.1
Khatir, Z.2
Lefebvre, S.3
Meuret, R.4
Parmentier, B.5
Bontemps, S.6
-
6
-
-
34548769316
-
Degradation behavior of 600 V-200 A IGBT modules under power cycling and high temperature environment conditions
-
M. Bouarroudj, Z. Khatir, J.P. Ousten, F. Badel, L. Dupont, S. Lefebvre, "Degradation behavior of 600 V-200 A IGBT modules under power cycling and high temperature environment conditions,"Microelectronics Reliability, vol. 47, no. 9-11, pp. 1719-1724, 2007
-
(2007)
Microelectronics Reliability
, vol.47
, Issue.9-11
, pp. 1719-1724
-
-
Bouarroudj, M.1
Khatir, Z.2
Ousten, J.P.3
Badel, F.4
Dupont, L.5
Lefebvre, S.6
-
7
-
-
69249216402
-
Design for reliability of power electronics modules
-
H. Lu, C. Bailey, C. Yin, "Design for reliability of power electronics modules," Microelectronics Reliability, vol. 49, no. 9-11, pp. 1250-1255, 2009
-
(2009)
Microelectronics Reliability
, vol.49
, Issue.9-11
, pp. 1250-1255
-
-
Lu, H.1
Bailey, C.2
Yin, C.3
-
8
-
-
79551499778
-
Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition
-
A. Oukaour, B. Tala-Ighil, B. Pouderoux, M. Tounsi, M. Bouarroudj- Berkani, S. Lefebvre, B. Boudart, "Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition," Microelectronics Reliability, vol. 51, no. 2, pp. 386-391, 2011
-
(2011)
Microelectronics Reliability
, vol.51
, Issue.2
, pp. 386-391
-
-
Oukaour, A.1
Tala-Ighil, B.2
Pouderoux, B.3
Tounsi, M.4
Bouarroudj- Berkani, M.5
Lefebvre, S.6
Boudart, B.7
-
9
-
-
79952448541
-
High-temperature lead-free solder alternatives
-
June
-
V. Chidambaram, J. Hattel, J. Hald, "High-temperature lead-free solder alternatives," Microelectronic Engineering, vol. 88, no. 6, pp. 981-989, June 2011
-
(2011)
Microelectronic Engineering
, vol.88
, Issue.6
, pp. 981-989
-
-
Chidambaram, V.1
Hattel, J.2
Hald, J.3
-
10
-
-
0036826433
-
Pressure-assisted low-temperature sintering of silver paste as an alternative die-attach solution to solder reflow
-
Z. Zhang and G.-Q. Lu, "Pressure-assisted low-temperature sintering of silver paste as an alternative die-attach solution to solder reflow,"IEEE Transactions on Electronics Packaging Manufacturing, vol. 25, no. 4, pp. 279-283, 2002
-
(2002)
IEEE Transactions on Electronics Packaging Manufacturing
, vol.25
, Issue.4
, pp. 279-283
-
-
Zhang, Z.1
Lu, G.-Q.2
-
11
-
-
81355158732
-
Low temperature sinter technology Die attachment for automotive power electronic applications
-
C. Göbl, P. Beckedahl, H. Braml, "Low temperature sinter technology Die attachment for automotive power electronic applications," in Automotive Power Electronics, 2006, pp. 1-5
-
(2006)
Automotive Power Electronics
, pp. 1-5
-
-
Göbl, C.1
Beckedahl, P.2
Braml, H.3
-
12
-
-
77949570776
-
Low-Temperature Sintering of Nanoscale Silver Paste for Attaching Large- Area (>100mm2) Chips
-
T. G. Lei, J.N. Calata, G.-Q. Lu, X. Chen, and S. Luo, "Low-Temperature Sintering of Nanoscale Silver Paste for Attaching Large- Area (>100mm2) Chips", IEEE Transactions on Components and Packaging Technologies, vol. 33, no. 1, pp. 98-104, 2010
-
(2010)
IEEE Transactions on Components and Packaging Technologies
, vol.33
, Issue.1
, pp. 98-104
-
-
Lei, T.G.1
Calata, J.N.2
Lu, G.-Q.3
Chen, X.4
Luo, S.5
-
14
-
-
77957778805
-
Transient Liquid Phase Die Attach for High-Temperature Silicon Carbide Power Devices
-
Sep.
-
H. A. Mustain, W. D. Brown, and S. S. Ang, "Transient Liquid Phase Die Attach for High-Temperature Silicon Carbide Power Devices,"IEEE Transactions on Components and Packaging Technologies, vol. 33, no. 3, pp. 563-570, Sep. 2010
-
(2010)
IEEE Transactions on Components and Packaging Technologies
, vol.33
, Issue.3
, pp. 563-570
-
-
Mustain, H.A.1
Brown, W.D.2
Ang, S.S.3
-
15
-
-
84870534843
-
Reliability Study of Au-In Transient Liquid Phase Bonding for SiC Power Semiconductor Packaging
-
B. Grummel, H. A. Mustain, Z. J. Shen, and A. R. Hefner, "Reliability Study of Au-In Transient Liquid Phase Bonding for SiC Power Semiconductor Packaging," in International Symposium on Power Semiconductor Devices & IC's, 2011, pp. 260-263
-
International Symposium on Power Semiconductor Devices & IC's, 2011
, pp. 260-263
-
-
Grummel, B.1
Mustain, H.A.2
Shen, Z.J.3
Hefner, A.R.4
-
17
-
-
79951854594
-
New assembly and interconnects beyond sintering methods
-
K. Guth, D. Siepe, J. Gorlich, H. Torwesten, et al. "New assembly and interconnects beyond sintering methods," in Power Conversion Intelligent Motion (PCIM), 2010, pp. 232-237
-
(2010)
Power Conversion Intelligent Motion (PCIM)
, pp. 232-237
-
-
Guth, K.1
Siepe, D.2
Gorlich, J.3
Torwesten, H.4
-
18
-
-
28444454086
-
Transfer of Metal MEMS Packages Using a Wafer-level Solder Transfer Technique
-
W. C. Welch, J. Chae, K. Najafi, "Transfer of Metal MEMS Packages Using a Wafer-level Solder Transfer Technique," IEEE Transactions on Advanced Packaging, vol. 28, pp. 643-649, 2005
-
(2005)
IEEE Transactions on Advanced Packaging
, vol.28
, pp. 643-649
-
-
Welch, W.C.1
Chae, J.2
Najafi, K.3
|