Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition

Microelectronics Reliability

Volumn 51, Issue 2, 2011, Pages 386-391

  Oukaour, A ^a   Tala Ighil, B ^a   Pouderoux, B ^a   Tounsi, M ^a   Bouarroudj Berkani, M ^b   Lefebvre, S ^b   Boudart, B ^a  

^a Université de Caen Normandie   (France)

^b Centre National de la Recherche Scientifique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AGEING TESTS; ARTIFICIAL TRAINING; DEFECT DETECTION; DEVICE OPERATIONS; DEVICE PERFORMANCE; FAILURE DIAGNOSIS; INSULATED GATE BIPOLAR TRANSISTOR MODULES; POWER CYCLING; POWER MODULE; THERMO-MECHANICAL;

BIPOLAR TRANSISTORS; DEFECTS; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); PATTERN RECOGNITION; TESTING;

ACTIVE FILTERS;

EID: 79551499778     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2010.08.006     Document Type: Conference Paper

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