The effect of random dopant fluctuations on logic timing at low voltage

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 20, Issue 5, 2012, Pages 911-924

  Rithe, Rahul ^a   Chou, Sharon ^b   Gu, Jie ^c   Wang, Alice ^d   Datla, Satyendra ^d   Gammie, Gordon ^d   Buss, Dennis ^d   Chandrakasan, Anantha ^a  

^a Department of Electrical Engineering and Computer Science   (United States)

^b Stanford University   (United States)

^c MaxLinear Inc   (United States)

^d TEXAS INSTRUMENTS   (United States)

Author keywords

Local variations; low voltage operation; random dopant fluctuations; timing analysis; timing closure

Indexed keywords

LOCAL VARIATIONS; LOW VOLTAGE OPERATION; RANDOM DOPANT FLUCTUATION; TIMING ANALYSIS; TIMING CLOSURE;

COMPUTER SIMULATION; ELECTRIC BATTERIES; GAUSSIAN NOISE (ELECTRONIC); MONTE CARLO METHODS; REGRESSION ANALYSIS; STOCHASTIC SYSTEMS;

COMPUTER AIDED DESIGN;

EID: 84859801101     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2011.2124477     Document Type: Article

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