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Volumn , Issue , 2010, Pages 965-968

Non-linear operating point statistical analysis for local variations in logic timing at low voltage

Author keywords

Local variations; Low voltage; SSTA; Statistical design

Indexed keywords

COMPUTATION THEORY; COMPUTER AIDED DESIGN; DELAY CIRCUITS; MONTE CARLO METHODS; PROBABILITY DENSITY FUNCTION; STOCHASTIC SYSTEMS; TIMING CIRCUITS; TIMING DEVICES;

EID: 77953085640     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/date.2010.5456911     Document Type: Conference Paper
Times cited : (16)

References (8)
  • 2
    • 0032320827 scopus 로고    scopus 로고
    • Random dopant induced threshold voltage lowering and fluctuations
    • A. Asenov, "Random dopant induced threshold voltage lowering and fluctuations," Electron Devices, IEEE Transactions on, vol. 45, pp. 2505-2513, 1998.
    • (1998) Electron Devices, IEEE Transactions on , vol.45 , pp. 2505-2513
    • Asenov, A.1
  • 3
    • 0042229214 scopus 로고    scopus 로고
    • Random doping-induced fluctuations of subthreshold characteristics in MOSFET devices
    • P. Andrei and I. Mayergoyz, "Random doping-induced fluctuations of subthreshold characteristics in MOSFET devices," Solid-State Electronics, vol. 47, pp. 2055-2061, 11. 2003.
    • (2003) Solid-State Electronics , vol.47 , Issue.11 , pp. 2055-2061
    • Andrei, P.1    Mayergoyz, I.2
  • 5
    • 0348040085 scopus 로고    scopus 로고
    • Statistical Timing Analysis for Intra-die Process Variations with Spatial Correlations
    • A. Agarwal, D. Blaauw, V. Zolotov, "Statistical Timing Analysis for Intra-die Process Variations with Spatial Correlations", Proceedings of ICCAD 2003, pp 900-907, 2003.
    • (2003) Proceedings of ICCAD 2003 , pp. 900-907
    • Agarwal, A.1    Blaauw, D.2    Zolotov, V.3
  • 6
    • 33646920106 scopus 로고    scopus 로고
    • On Statistical Timing Analysis with Inter-and Intra-die Variations
    • H. Mangassarian, M. Anis, "On Statistical Timing Analysis with Inter-and Intra-die Variations", Proceedings of DATE 2005, pp. 132-137, 2005.
    • (2005) Proceedings of DATE 2005 , pp. 132-137
    • Mangassarian, H.1    Anis, M.2
  • 7
    • 49549097560 scopus 로고    scopus 로고
    • Non-Gaussian Statistical Timing Models of Die-to-Die and Within-Die Parameter Variations for Full Chip Analysis
    • 20008
    • K. Homma, I. Nitta, T. Shibuya, "Non-Gaussian Statistical Timing Models of Die-to-Die and Within-Die Parameter Variations for Full Chip Analysis", Proceedings of ASP-DAC 2008, pp. 292-297, 20008.
    • Proceedings of ASP-DAC 2008 , pp. 292-297
    • Homma, K.1    Nitta, I.2    Shibuya, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.