Characterization of standard cells for intra-cell mismatch variations

Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008

Volumn , Issue , 2008, Pages 213-219

  Sundareswaran, Savithri ^a   Abraham, Jacob A ^b   Ardelea, Alexandre ^c   Panda, Rajendran ^a  

^a FREESCALE SEMICONDUCTOR INC   (United States)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^c SUN MICROSYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CELLS; CHLORINE COMPOUNDS; DIGITAL LIBRARIES; ELECTRIC BATTERIES; ELECTRONICS ENGINEERING; MONTE CARLO METHODS; STANDARDS; STATISTICAL METHODS; TIME DELAY;

CELL MISMATCH; CLUSTERING APPROACH; DELAY VARIATIONS; DEVICE FLUCTUATION; ELECTRONIC DESIGNS; INTERNATIONAL SYMPOSIUM; MONTE-CARLO SIMULATIONS; OUTPUT TRANSITION; PARAMETER VARIATIONS; RUN-TIME; RUN-TIME COMPLEXITY; STANDARD CELLS; STATISTICAL CHARACTERIZATION; STATISTICAL TIMING; SWITCHING DEVICES;

CYTOLOGY;

EID: 49749125058     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2008.4479728     Document Type: Conference Paper

References (5)

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