Cell library characterization at low voltage using non-linear operating point analysis of local variations

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 2011, Pages 112-117

  Rithe, Rahul ^a   Chou, Sharon ^b   Gu, Jie ^c   Wang, Alice ^d   Datla, Satyendra ^d   Gammie, Gordon ^d   Buss, Dennis ^d   Chandrakasan, Anantha ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b STANFORD UNIVERSITY   (United States)

^c MaxLinear Inc   (United States)

^d TEXAS INSTRUMENTS   (United States)

Author keywords

Local variations; Low voltage; Timing analysis

Indexed keywords

CELL LIBRARY; COMPUTATIONALLY EFFICIENT; LOCAL VARIATIONS; LOGIC CELLS; LOGIC DELAYS; LOW VOLTAGE; LOW VOLTAGES; MONTE CARLO ANALYSIS; NON-GAUSSIAN; NON-LINEAR; OPERATING POINTS; PROBABILITY DENSITY FUNCTION (PDF); RANDOM DOPANT FLUCTUATION; SPICE-BASED; STOCHASTIC COMPONENT; STOCHASTIC DELAY; SUPPLY VOLTAGES; TIMING ANALYSIS;

DESIGN; LOGIC DEVICES; PROBABILITY DENSITY FUNCTION; STOCHASTIC SYSTEMS;

EMBEDDED SYSTEMS;

EID: 79952823480     PISSN: 10639667     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSID.2011.43     Document Type: Conference Paper

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