Statistical-variability compact-modeling strategies for BSIM4 and PSP

IEEE Design and Test of Computers

Volumn 27, Issue 2, 2010, Pages 26-35

  Cheng, Binjie ^a   Dideban, Daryoosh ^a   Moezi, Negin ^a   Millar, Campbell ^a   Roy, Gareth ^a   Wang, Xingsheng ^a   Roy, Scott ^a   Asenov, Asen ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

Design and test; Mismatch; MOSFET; Statistical compact modeling; Statistical variability

Indexed keywords

ATOMISTIC SIMULATIONS; COMPACT DEVICES; COMPACT MODELING; MODELING STRATEGY; MOS-FET; STATISTICAL COMPACT MODELING; STATISTICAL MODELS; STATISTICAL PARAMETERS; STATISTICAL VARIABILITY; VARIABILITY-AWARE DESIGN;

DESIGN; MOSFET DEVICES; POWDERS; THREE DIMENSIONAL;

STATISTICS;

EID: 77950124718     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2010.53     Document Type: Article

References (10)

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