Contact characterization by photoemission and device performance in P3HT based organic transistors

Journal of Applied Physics

Volumn 111, Issue 6, 2012, Pages

  Scheinert, S ^a   Grobosch, M ^b   Paasch, G ^b   Horselmann I ^a   Knupfer, M ^b   Bartsch, J ^a  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BARRIER LOWERING; CARRIER INJECTION; CURRENT CHARACTERISTIC; DEVICE PERFORMANCE; DEVICE SIMULATIONS; GAUSSIAN DENSITY OF STATE; GAUSSIANS; GOLD CONTACTS; GOLD SOURCE; HOLE BARRIER; HOLE INJECTION BARRIERS; HOPPING TRANSPORT; IMAGE CHARGES; METAL/ORGANIC INTERFACES; ORGANIC DEVICES; ORGANIC LAYERS; ORGANIC TRANSISTOR; ORGANICS; SOURCE/DRAIN ELECTRODES;

GOLD; ORGANIC FIELD EFFECT TRANSISTORS; PHOTOELECTRON SPECTROSCOPY;

WORK FUNCTION;

EID: 84859551465     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3693541     Document Type: Article

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