Photoemission spectroscopy and atomic force microscopy investigation of vapor-phase codeposited silver/poly(3-hexylthiophene) composites

ACS Applied Materials and Interfaces

Volumn 1, Issue 12, 2009, Pages 2721-2728

  Scudiero, L ^a   Wei, Haoyan ^b   Eilers, Hergen ^b  

^a WASHINGTON STATE UNIVERSITY   (United States)

^b WASHINGTON STATE UNIVERSITY   (United States)

Author keywords

nanocomposites; photoelectron spectroscopy; polythiophene; silver; vapor phase codeposition

Indexed keywords

AFM; AFM IMAGE; AG NANOPARTICLE; BAND EDGE; BARRIER HEIGHTS; CHEMICAL BINDING; CHEMICAL NATURE; CODEPOSITION; CONJUGATED STRUCTURES; CONTACT LAYERS; EV REGION; HOLE INJECTION; IN-SITU; PHOTOEMISSION SPECTROSCOPY; POLYTHIOPHENE; SOLUTION-PROCESSED; UPS SPECTRA; VAPOR PHASE; VAPOR PHASE CODEPOSITION; XPS;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CARRIER MOBILITY; ELECTRONIC PROPERTIES; EMISSION SPECTROSCOPY; MICROSTRUCTURE; NANOCOMPOSITES; NANOPARTICLES; ORGANIC POLYMERS; PHOTOELECTRICITY; PHOTONS; SULFUR; VAPORS; X RAY PHOTOELECTRON SPECTROSCOPY;

SILVER;

EID: 79955441338     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am900582w     Document Type: Article

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