Further insights into the photodegradation of poly(3-hexylthiophene) by means of X-ray photoelectron spectroscopy

Thin Solid Films

Volumn 518, Issue 23, 2010, Pages 7113-7118

  Manceau, Matthieu ^a,b   Gaume, Julien ^a   Rivaton, Agnès ^a   Gardette, Jean Luc ^a   Monier, Guillaume ^a,c   Bideux, Luc ^a,c  

^a UNIVERSITÉ CLERMONT AUVERGNE   (France)

^b CEA GRENOBLE   (France)

^c CNRS   (France)

Author keywords

Degradation; Organic photovoltaic; Poly(3 hexylthiophene); UV light irradiation; X ray photoelectron spectroscopy

Indexed keywords

ABSORBANCES; CARBONYL MOIETY; CHEMICAL CHANGE; DEGRADATION PRODUCTS; ORGANIC PHOTOVOLTAICS; PHOTOVOLTAIC APPLICATIONS; POLY (3-HEXYLTHIOPHENE); SIDE-CHAIN; SPECTRAL ANALYSIS; STEPWISE OXIDATION; SULFINATE ESTERS; SULPHUR ATOMS; UV-LIGHT IRRADIATION; UV-VISIBLE; XPS DATA;

CARRIER MOBILITY; ELECTRONS; ESTERS; IRRADIATION; PHOTODEGRADATION; PHOTOELECTRICITY; PHOTONS; PHOTOOXIDATION; SPECTRUM ANALYSIS; SPECTRUM ANALYZERS; SULFUR; X RAYS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77956230927     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.06.042     Document Type: Article

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