Origin of the interface dipole at interfaces between undoped organic semiconductors and metals

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 23, Issue 4, 2005, Pages 1072-1077

  Knupfer, M ^a   Paasch, G ^a  

^a IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; SEMICONDUCTING ORGANIC COMPOUNDS;

INTERFACE DIPOLE; INTERFACIAL LAYERS;

INTERFACES (MATERIALS);

EID: 27644519361     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1885021     Document Type: Conference Paper

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