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Applied Physics Letters

Volumn 97, Issue 6, 2010, Pages

Understanding contact behavior in organic thin film transistors

(3) Wang, S D a Yan, Y a Tsukagoshi, K b

a SOOCHOW UNIVERSITY (China)

b NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BOTTOM-CONTACT; CHARGE ACCUMULATION; CHARGE TRAP; CONTACT BEHAVIOR; CURRENT MODELING; ORGANIC ACTIVE LAYERS; ORGANIC THIN FILM TRANSISTORS;

CONTACT RESISTANCE; THIN FILMS; TRANSPORT PROPERTIES; VAPOR DEPOSITION;

THIN FILM TRANSISTORS;

EID: 77955739053 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3479531 Document Type: Article

Times cited : (72)

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