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Volumn 55, Issue 4, 2012, Pages 951-955

Influence of sputtering power on properties of ZnO thin films fabricated by RF sputtering in room temperature

Author keywords

room temperature process; sputtering power; transparent oxide semiconductor; ZnO thin film

Indexed keywords


EID: 84858285524     PISSN: 1674733X     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11432-011-4347-z     Document Type: Article
Times cited : (11)

References (20)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.