Effect of heat treatment on characteristics of nanocrystalline ZnO films by electron beam evaporation

Vacuum

Volumn 86, Issue 7, 2012, Pages 871-875

  Varnamkhasti, Mohsen Ghasemi ^a   Fallah, Hamid Reza ^a   Zadsar, Mehdi ^a  

^a UNIVERSITY OF ISFAHAN   (Iran)

Author keywords

Annealing temperature; Optical transmission; SEM images; X ray diffraction; ZnO films

Indexed keywords

ANNEALING PRESSURE; ANNEALING TEMPERATURES; ANNEALING TREATMENTS; CRYSTAL QUALITIES; ELECTRICAL , OPTICAL AND STRUCTURAL PROPERTIES; ELECTRICAL RESISTIVITY; ELECTRON BEAM EVAPORATION; GLASS SUBSTRATES; GRAIN SIZE; MAXIMUM INTENSITIES; NANOCRYSTALLINE ZNO; OPTICAL TRANSMISSIONS; ROOM TEMPERATURE; SCANNING ELECTRON MICROSCOPY IMAGE; SEM IMAGES; ZINC OXIDE THIN FILMS; ZNO FILMS;

ELECTRIC CONDUCTIVITY; ELECTRON BEAMS; EVAPORATION; GRAIN SIZE AND SHAPE; METALLIC FILMS; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

ANNEALING;

EID: 84857215479     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2011.03.017     Document Type: Conference Paper

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