Structural, electrical and optical properties of ZnO thin films deposited by sol-gel method

Microelectronics Journal

Volumn 39, Issue 12, 2008, Pages 1425-1428

  Sahal, M ^a,b   Hartiti, B ^a   Ridah, A ^a   Mollar, M ^b   Mari B ^b  

^a HASSAN II UNIVERSITY OF CASABLANCA   (Morocco)

^b UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

Al doped ZnO; Sol gel; Spin coating; Thin films

Indexed keywords

ALUMINUM COATINGS; II-VI SEMICONDUCTORS; METALLIC FILMS; OPTICAL PROPERTIES; ORGANIC SOLVENTS; SEMICONDUCTOR DOPING; SOL-GEL PROCESS; SOL-GELS; SPIN COATING; SPIN GLASS; SUBSTRATES; THIN FILMS; ZINC OXIDE; ZINC SULFIDE;

AL-DOPED ZNO; ELECTRICAL AND OPTICAL PROPERTIES; FUNDAMENTAL ABSORPTION EDGE; HEXAGONAL WURTZITE STRUCTURE; INTRINSIC AND AL-DOPED ZNO; OPTICAL CHARACTERIZATION; PREFERENTIAL ORIENTATION; UV PHOTOLUMINESCENCE;

OPTICAL FILMS;

EID: 56049098153     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2008.06.085     Document Type: Article

References (22)

1. Ismail B., Abaab M., and Rezig B. Thin Solid Films 383 (2001) 92-94
2. Jarzebzki Z.M. In: Pamplin R.B. (Ed). Oxide Semiconductors (1973), Pergamon Press, Oxford 239
3. Jayakrishnan R., and Hodes G. Thin Solid Films 440 (2003) 19-25
4. Goyal D.J., Agashe C., Takwale M.G., Marathe B.R., and Bhide V.G. J. Mater. Sci. 27 (1992) 4705
5. Sanchez-Juarez A., Tiburcio-Silver A., and Ortiz A. Sol. Energy Mater. Sol. Cells 52 (1998) 301-311
6. Ezhilvalavan S., and Kutty T.R.N. Mater. Chem. Phys. 49 (1997) 258-269
7. de la Olvera M.L., and Asomoza R. Sens. Actuators B 45 (1997) 49
8. In: Bhatt R., Sankaranarayanan H., Ferekides C.S., and Morel D.H. (Eds). Proceedings of the 26th PVSC vol. 171 (1997), Anaheim, California 383
9. Sans J.A., Segura A., Mollar M., and Marí B. Thin Solid Films 453-454 (2004) 251-255
10. Kashiwaba Y., Katahira F., Haga K., Sekiguchi T., and Watanabe H. J. Cryst. Growth 221 (2000) 431-434
11. Paraguay D.F., Estrada L.W., Acosta N.D.R., Andrade E., and Miki-Yoshida M. Thin Solid Films 350 (1999) 192-202
12. Kamalasanan M.N., and Chandra S. Thin Solid Films 288 (1996) 112-115
13. Cembrero J., Elmanouni A., Hartiti B., Mollar M., and Marí B. Thin Solid Films 451-452 (2004) 198-202
14. Musat V., Teixeira B., Fortunato E., and Monteiro R.C.C. Thin Solid Films 502 (2006) 219-222
15. Kuo S.Y., Chen W.C., Lai F.-I., Cheng C.P., Kuo H.C., Wang S.C., and Hsieh W.F. J. Cryst. Growth 287 (2006) 78
16. Powder Diffraction File Data Card 5-644, 3cPDS International Center for Diffraction Data, Swartmore, PA.
17. Kim H., Piqué A., Horwitz J.S., Murata H., Kafafi Z.H., Gilmore C.M., and Chrisey D.B. Thin Solid Films 377-378 (2000) 798-802
18. Lin S.-S., Huang J.-L., and Sajgalik P. Surf. Coat. Techn. 185 (2004) 254-263
19. Burstein E. Phys. Rev. 93 (1954) 632
20. Moss T.S. Proc. Phys. Soc. London Sect. B 67 (1954) 775
21. Bagnall D.M., Chen Y.F., Shen M.Y., Zhu Z., Goto T., and Yao T. J. Cryst. Growth 184-185 (1998) 605-609
22. Marí B., Mollar M., Mechkour A., Hartiti B., Perales M., and Cembrero J. Microelectron. J. 35 (2004) 79-82