Effect of annealing on the electrical and optical properties of electron beam evaporated ZnO thin films

Thin Solid Films

Volumn 473, Issue 1, 2005, Pages 49-53

  Al Asmar, R ^a   Ferblantier, G ^a   Mailly, F ^a   Gall Borrut, P ^a   Foucaran, A ^a  

^a UNIVERSITÉ MONTPELLIER II   (France)

Author keywords

Electrical properties and measurements; Optical properties; Structural properties; Zinc oxide

Indexed keywords

ANNEALING; ELECTRIC CONDUCTIVITY; ELECTRON BEAMS; ELLIPSOMETRY; EVAPORATION; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL PROPERTIES; SURFACE ROUGHNESS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CRYSTAL QUALITY; ELECTRICAL PROPERTIES AND MEASUREMENTS; ELLIPSOMETER MEASUREMENTS; STRUCTURAL PROPERTIES;

ZINC OXIDE;

EID: 9644259092     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.06.156     Document Type: Article

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