-
1
-
-
59849089910
-
Junctionless multigate field-effect transistor
-
Feb.
-
C.-W. Lee, A. Afzalian, N. D. Akhavan, R. Yan, I. Ferain, and J.-P. Colinge, "Junctionless multigate field-effect transistor," Appl. Phys. Lett., vol. 94, no. 5, p. 053511, Feb. 2009.
-
(2009)
Appl. Phys. Lett.
, vol.94
, Issue.5
, pp. 053511
-
-
Lee, C.-W.1
Afzalian, A.2
Akhavan, N.D.3
Yan, R.4
Ferain, I.5
Colinge, J.-P.6
-
2
-
-
77949275137
-
Nanowire transistors without junctions
-
Mar.
-
J.-P. Colinge, C.-W. Lee, A. Afzalian, N. D. Akhavan, R. Yan, I. Ferain, P. Razavi, B. O'Neill, A. Blake, M. White, A.-M. Kelleher, B. McCarthy, and R. Murphy, "Nanowire transistors without junctions," Nat. Nanotechnol., vol. 5, no. 3, pp. 225-229, Mar. 2010.
-
(2010)
Nat. Nanotechnol.
, vol.5
, Issue.3
, pp. 225-229
-
-
Colinge, J.-P.1
Lee, C.-W.2
Afzalian, A.3
Akhavan, N.D.4
Yan, R.5
Ferain, I.6
Razavi, P.7
O'Neill, B.8
Blake, A.9
White, M.10
Kelleher, A.-M.11
McCarthy, B.12
Murphy, R.13
-
5
-
-
77249173867
-
Reduced electric field in junctionless transistors
-
Feb.
-
J.-P. Colinge, C.-W. Lee, I. Ferain, N. D. Akhavan, R. Yan, P. Razavi, R. Yu, A. N. Nazarov, and R. T. Doria, "Reduced electric field in junctionless transistors," Appl. Phys. Lett., vol. 96, no. 7, p. 073510, Feb. 2010.
-
(2010)
Appl. Phys. Lett.
, vol.96
, Issue.7
, pp. 073510
-
-
Colinge, J.-P.1
Lee, C.-W.2
Ferain, I.3
Akhavan, N.D.4
Yan, R.5
Razavi, P.6
Yu, R.7
Nazarov, A.N.8
Doria, R.T.9
-
6
-
-
77955756447
-
Simulation of junctionless Si nanowire transistors with 3 nm gate length
-
Aug.
-
L. Ansari, B. Feldman, G. Fagas, J.-P. Colinge, and J. C. Greer, "Simulation of junctionless Si nanowire transistors with 3 nm gate length," Appl. Phys. Lett., vol. 97, no. 6, p. 062105, Aug. 2010.
-
(2010)
Appl. Phys. Lett.
, vol.97
, Issue.6
, pp. 062105
-
-
Ansari, L.1
Feldman, B.2
Fagas, G.3
Colinge, J.-P.4
Greer, J.C.5
-
7
-
-
79958015315
-
Numerical investigation on the junctionless nanowire FET
-
Mar.
-
E. Gnani, A. Gnudi, S. Reggiani, G. Baccarani, N. Shen, N. Singh, G. Q. Lo, and D. L. Kwong, "Numerical investigation on the junctionless nanowire FET," in Proc. IEEE ULIS, Mar. 2011, pp. 1-4.
-
(2011)
Proc. IEEE ULIS
, pp. 1-4
-
-
Gnani, E.1
Gnudi, A.2
Reggiani, S.3
Baccarani, G.4
Shen, N.5
Singh, N.6
Lo, G.Q.7
Kwong, D.L.8
-
8
-
-
80052031065
-
Comparison of junctionless and conventional trigate transistors with Lg down to 26 nm
-
Sep.
-
R. Rios, A. Cappellani, M. Armstrong, A. Budrevich, H. Gomez, R. Pai, N. Rahhal-orabi, and K. Kuhn, "Comparison of junctionless and conventional trigate transistors with Lg down to 26 nm," IEEE Electron Device Lett., vol. 32, no. 9, pp. 1170-1172, Sep. 2011.
-
(2011)
IEEE Electron Device Lett.
, vol.32
, Issue.9
, pp. 1170-1172
-
-
Rios, R.1
Cappellani, A.2
Armstrong, M.3
Budrevich, A.4
Gomez, H.5
Pai, R.6
Rahhal-Orabi, N.7
Kuhn, K.8
-
9
-
-
80052030092
-
Stress effects on self-aligned silicon nanowire junctionless field-effect transistors
-
Sep.
-
C. J. Huang, C. H. Yang, C. Y. Hsueh, J. H. Lee, Y. T. Chang, and S. C. Lee, "Stress effects on self-aligned silicon nanowire junctionless field-effect transistors," IEEE Electron Device Lett., vol. 32, no. 9, pp. 1194-1196, Sep. 2011.
-
(2011)
IEEE Electron Device Lett.
, vol.32
, Issue.9
, pp. 1194-1196
-
-
Huang, C.J.1
Yang, C.H.2
Hsueh, C.Y.3
Lee, J.H.4
Chang, Y.T.5
Lee, S.C.6
-
10
-
-
67650127116
-
Current variability in Si nanowire MOSFETs due to random dopants in the source/drain regions: A fully 3-D NEGF simulation study
-
Jul.
-
N. Seoane, A. Martinez, A. Brown, J. Barker, and A. Asenov, "Current variability in Si nanowire MOSFETs due to random dopants in the source/drain regions: A fully 3-D NEGF simulation study," IEEE Trans. Electron Devices, vol. 56, no. 7, pp. 1388-1395, Jul. 2009.
-
(2009)
IEEE Trans. Electron Devices
, vol.56
, Issue.7
, pp. 1388-1395
-
-
Seoane, N.1
Martinez, A.2
Brown, A.3
Barker, J.4
Asenov, A.5
-
11
-
-
33745711573
-
A three-dimensional simulation of quantum transport in silicon nanowire transistor in the presence of electron-phonon interactions
-
Jun.
-
S. Jin, Y. J. Park, and H. S. Min, "A three-dimensional simulation of quantum transport in silicon nanowire transistor in the presence of electron-phonon interactions," J. Appl. Phys., vol. 99, no. 12, p. 123719, Jun. 2006.
-
(2006)
J. Appl. Phys.
, vol.99
, Issue.12
, pp. 123719
-
-
Jin, S.1
Park, Y.J.2
Min, H.S.3
-
12
-
-
84893264597
-
Modeling of electron mobility in gated silicon nanowires at room temperature: Surface roughness scattering, dielectric screening, and band nonparabolicity
-
Oct.
-
S. Jin, M. V. Fischetti, and T.-W. Tang, "Modeling of electron mobility in gated silicon nanowires at room temperature: Surface roughness scattering, dielectric screening, and band nonparabolicity," J. Appl. Phys., vol. 102, no. 8, p. 083715, Oct. 2007.
-
(2007)
J. Appl. Phys.
, vol.102
, Issue.8
, pp. 083715
-
-
Jin, S.1
Fischetti, M.V.2
Tang, T.-W.3
-
13
-
-
81355142770
-
Non-equilibrium Green's function analysis of cross section and channel length dependence of phonon scattering and its impact on the performance of Si nanowire field effect transistors
-
Nov.
-
M. Aldegunde, A. Martinez, and A. Asenov, "Non-equilibrium Green's function analysis of cross section and channel length dependence of phonon scattering and its impact on the performance of Si nanowire field effect transistors," J. Appl. Phys., vol. 110, no. 9, p. 094518, Nov. 2011.
-
(2011)
J. Appl. Phys.
, vol.110
, Issue.9
, pp. 094518
-
-
Aldegunde, M.1
Martinez, A.2
Asenov, A.3
-
14
-
-
79251566182
-
Phonon-limited and effective low-field mobility in n-and p-type [100]-, [110]-, and [111]-oriented Si nanowire transistors
-
Jan.
-
M. Luisier, "Phonon-limited and effective low-field mobility in n-and p-type [100]-, [110]-, and [111]-oriented Si nanowire transistors," Appl. Phys. Lett., vol. 98, no. 3, p. 032111, Jan. 2011.
-
(2011)
Appl. Phys. Lett.
, vol.98
, Issue.3
, pp. 032111
-
-
Luisier, M.1
-
15
-
-
80054974004
-
Electron-phonon scattering in Si and Ge: From bulk to nanodevices
-
Sep.
-
D. Rideau, W. Zhang, Y. M. Niquet, C. Delerue, C. Tavernier, and H. Jaouen, "Electron-phonon scattering in Si and Ge: From bulk to nanodevices," in Proc. Int. Conf. Simul. Semicond. Process. Devices, Sep. 2011, pp. 47-50.
-
(2011)
Proc. Int. Conf. Simul. Semicond. Process. Devices
, pp. 47-50
-
-
Rideau, D.1
Zhang, W.2
Niquet, Y.M.3
Delerue, C.4
Tavernier, C.5
Jaouen, H.6
-
16
-
-
80052689784
-
A novel junctionless all-around-gate SONOS device with a quantum nanowire on a bulk substrate for 3D stack NAND flash memory
-
S.-J. Choi, D.-I. Moon, J. P. Duarte, S. Kim, and Y.-K. Choi, "A novel junctionless all-around-gate SONOS device with a quantum nanowire on a bulk substrate for 3D stack NAND flash memory," in VLSI Symp. Tech. Dig., 2011, pp. 74-75.
-
(2011)
VLSI Symp. Tech. Dig.
, pp. 74-75
-
-
Choi, S.-J.1
Moon, D.-I.2
Duarte, J.P.3
Kim, S.4
Choi, Y.-K.5
-
17
-
-
79960838875
-
Process technology variation
-
Aug.
-
K. J. Kuhn, M. D. Giles, D. Becher, P. Kolar, A. Kornfeld, R. Kotlyar, S. T. Ma, A. Maheshwari, and S. Mudanai, "Process technology variation," IEEE Trans. Electron Devices, vol. 58, no. 8, pp. 2197-2208, Aug. 2011.
-
(2011)
IEEE Trans. Electron Devices
, vol.58
, Issue.8
, pp. 2197-2208
-
-
Kuhn, K.J.1
Giles, M.D.2
Becher, D.3
Kolar, P.4
Kornfeld, A.5
Kotlyar, R.6
Ma, S.T.7
Maheshwari, A.8
Mudanai, S.9
-
18
-
-
80052086276
-
Theory of the junctionless nanowire FET
-
Sep.
-
E. Gnani, A. Gnudi, S. Reggiani, and G. Baccarani, "Theory of the junctionless nanowire FET," IEEE Trans. Electron Devices, vol. 58, no. 9, pp. 2903-2910, Sep. 2011.
-
(2011)
IEEE Trans. Electron Devices
, vol.58
, Issue.9
, pp. 2903-2910
-
-
Gnani, E.1
Gnudi, A.2
Reggiani, S.3
Baccarani, G.4
-
19
-
-
79151480956
-
Sensitivity of threshold voltage to nanowire width variation in junctionless transistors
-
Feb.
-
S.-J. Choi, D.-I. Moon, S. Kim, J. P. Duarte, and Y.-K. Choi, "Sensitivity of threshold voltage to nanowire width variation in junctionless transistors," IEEE Electron Device Lett., vol. 32, no. 2, pp. 125-127, Feb. 2011.
-
(2011)
IEEE Electron Device Lett.
, vol.32
, Issue.2
, pp. 125-127
-
-
Choi, S.-J.1
Moon, D.-I.2
Kim, S.3
Duarte, J.P.4
Choi, Y.-K.5
-
20
-
-
79960848133
-
Quantum-transport study on the impact of channel length and cross sections on variability induced by random discrete dopants in narrow gate-all-around silicon nanowire transistors
-
Aug.
-
A. Martinez, M. Aldegunde, N. Seoane, A. R. Brown, J. R. Barker, and A. Asenov, "Quantum-transport study on the impact of channel length and cross sections on variability induced by random discrete dopants in narrow gate-all-around silicon nanowire transistors," IEEE Trans. Electron Devices, vol. 58, no. 8, pp. 2209-2217, Aug. 2011.
-
(2011)
IEEE Trans. Electron Devices
, vol.58
, Issue.8
, pp. 2209-2217
-
-
Martinez, A.1
Aldegunde, M.2
Seoane, N.3
Brown, A.R.4
Barker, J.R.5
Asenov, A.6
|