AC conductance measurement and analysis of the conduction processes in HfO x based resistive switching memory

Applied Physics Letters

Volumn 99, Issue 23, 2011, Pages

  Yu, Shimeng ^a   Jeyasingh, Rakesh ^a   Wu, Yi ^a   Philip Wong, H S ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTANCE MEASUREMENT; CONDUCTION PROCESS; CONDUCTIVE FILAMENTS; CORNER FREQUENCY; DC BIAS; ELECTRON HOPPING; HIGH-RESISTANCE STATE; IMPEDANCE SPECTROSCOPY; LOWER FREQUENCIES; NEAREST NEIGHBORS; RESISTANCE VALUES; RESISTIVE SWITCHING MEMORIES; TUNNELING GAP;

PHYSICAL PROPERTIES; PHYSICS;

SWITCHING SYSTEMS;

EID: 83455172683     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3663968     Document Type: Article

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