Rietveld refinement of energy-dispersive synchrotron measurements

Zeitschrift fur Kristallographie

Volumn 226, Issue 12, 2011, Pages 934-943

  Apel, Daniel ^a   Klaus, Manuela ^a   Genzel, Christoph ^a   Balzar, Davor ^b  

^a HAHN MEITNER INSTITUT   (Germany)

^b UNIVERSITY OF DENVER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 82255193184     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.2011.1436     Document Type: Article

References (52)

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