Enhancement of energy dispersive residual stress analysis by consideration of detector electronic effects

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 262, Issue 1, 2007, Pages 87-94

  Denks, I A ^a   Genzel, Ch ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Energy dispersive diffraction; Residual stress analysis; Synchrotron radiation; X ray diffraction

Indexed keywords

CORRELATION METHODS; ENERGY DISPERSIVE SPECTROSCOPY; RESIDUAL STRESSES; STRESS ANALYSIS; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

CORRECTION FUNCTION; ELECTRONIC SHIFTS; ENERGY DISPERSIVE DIFFRACTION; GERMANIUM DETECTOR;

PARTICLE DETECTORS;

EID: 34447098483     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.05.007     Document Type: Article

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