Elastic-strain tensor by Rietveld refinement of diffraction measurements

Journal of Applied Physics

Volumn 84, Issue 9, 1998, Pages 4822-4833

  Balzar, Davor ^a   Von Dreele, Robert B ^b   Bennett, Kristin ^b   Ledbetter, Hassel ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001678175     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368724     Document Type: Article

References (41)

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