Residual stress depth profiling in complex hard coating systems by X-ray diffraction

Thin Solid Films

Volumn 517, Issue 3, 2008, Pages 1172-1176

  Klaus, M ^a   Genzel, Ch ^b   Holzschuh, H ^c  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

^c Walter AG   (Germany)

Author keywords

Multilayer systems; Residual stress analysis; Stress gradients; X ray diffraction

Indexed keywords

CARBIDES; COATINGS; CUTTING TOOLS; DEPTH PROFILING; DIFFRACTION; HARD COATINGS; MULTILAYERS; RESIDUAL STRESSES; STRENGTH OF MATERIALS; STRESS ANALYSIS; STRESS CONCENTRATION; X RAY ANALYSIS; X RAY DIFFRACTION;

ACCESSIBLE INFORMATIONS; CEMENTED CARBIDES; COATING SYSTEMS; EQUIVALENT THICKNESSES; INTER-LAYERS; MULTILAYER COATINGS; MULTILAYER STRUCTURES; MULTILAYER SYSTEMS; MULTILAYERED COATINGS; RESIDUAL STRESS ANALYSES; RESIDUAL STRESS ANALYSIS; RESIDUAL STRESS DISTRIBUTIONS; STRESS GRADIENTS; SUBSTRATE REGIONS; X-RAY DIFFRACTIONS;

X RAY DIFFRACTION ANALYSIS;

EID: 56949084454     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.05.018     Document Type: Article

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