Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS

Journal of Synchrotron Radiation

Volumn 9, Issue 2, 2002, Pages 77-81

  Korsunsky, Alexander M ^a   Collins, Steve P ^a   Alexander Owen, R ^a   Daymond, Mark R ^a   Achtioui, Saïda ^a   James, Karen E ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Energy dispersive X ray diffraction; Residual stress

Indexed keywords

ARTICLE;

EID: 0036521182     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049502001905     Document Type: Article

References (9)

1. Daymond, M. R., Bourke, M. A. M., Von Dreele, R. B., Clausen, B. & Lorentzen, T. (1997). J. Appl. Phys. 82, 1554-1562.
2. Korsunsky, A. M., Daymond, M. R. & Wells, K. E. (2000). Mater. Sci. Forum, 347/349, 492-497.
3. Korsunsky, A. M., James, K. E., Aylott, C. & Shaw, B. A. (2002). J. Strain Anal. Eng. Des. Submitted.
4. Korsunsky, A. M., Wells, K. E. & Withers, P. J. (1998). Scr. Mater. 39, 1705-1712.
5. Larson, A. C. & Von Dreele, R. B. (1994). GSAS. Los Alamos National Laboratory, New Mexico, USA.
6. Pyzalla, A. (2000). J. Nondestr. Eval. 19, 21-31.
7. Reimers, W., Pyzalla, A., Broda, M., Brusch, G., Dantz, D., Schmackers, T. & Liss, K. (1999). J. Mater. Sci. Lett. 18, 581-583.
8. Rietveld, H. M. (1969). J. Appl. Cryst. 2, 65-71.
9. Webster, P. J., Oosterkamp, L. D., Browne, P. A., Hughes, D. J., Kang, W. P., Withers, P. J. & Vaughan, G. B. M. (2001). J. Strain Anal. Eng. Des. 36, 61-70.