Higl-resolution strain mapping in bulk samples using full-profile analysis of ellergy-dispersive synchrotron X-ray diffraction data

Journal of Applied Crystallography

Volumn 37, Issue 6, 2004, Pages 883-889

  Steuwer, A ^a   Santisteban, J R ^b   Turski, M ^a   Withers, P J ^a   Buslaps, T ^c  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b OPEN UNIVERSITY   (United Kingdom)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; BULK SAMPLE; DATA ANALYSIS; ENERGY DISPERSIVE SYNCHROTRON X RAY DIFFRACTION; ENGINEERING; MEASUREMENT; ORGANIZATION; REFERENCE VALUE; SAMPLE; STRAIN MAPPING; VALIDATION PROCESS; X RAY DIFFRACTION;

EID: 10344253783     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889804023349     Document Type: Article

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